9 article(s) from Hölscher, Hendrik
Roll-to-roll fabrication of superhydrophobic pads covered with nanofur for the efficient clean-up of oil spills
- Patrick Weiser,
- Robin Kietz,
- Marc Schneider,
- Matthias Worgull and
- Hendrik Hölscher
Beilstein J. Nanotechnol. 2022, 13, 1228–1239, doi:10.3762/bjnano.13.102
Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy
- Weibin Wu,
- Christian Lutz,
- Simon Mersch,
- Richard Thelen,
- Christian Greiner,
- Guillaume Gomard and
- Hendrik Hölscher
Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243
Dry adhesives from carbon nanofibers grown in an open ethanol flame
- Christian Lutz,
- Julia Syurik,
- C. N. Shyam Kumar,
- Christian Kübel,
- Michael Bruns and
- Hendrik Hölscher
Beilstein J. Nanotechnol. 2017, 8, 2719–2728, doi:10.3762/bjnano.8.271
Bio-inspired micro-to-nanoporous polymers with tunable stiffness
- Julia Syurik,
- Ruth Schwaiger,
- Prerna Sudera,
- Stephan Weyand,
- Siegbert Johnsen,
- Gabriele Wiegand and
- Hendrik Hölscher
Beilstein J. Nanotechnol. 2017, 8, 906–914, doi:10.3762/bjnano.8.92
Copper atomic-scale transistors
- Fangqing Xie,
- Maryna N. Kavalenka,
- Moritz Röger,
- Daniel Albrecht,
- Hendrik Hölscher,
- Jürgen Leuthold and
- Thomas Schimmel
Beilstein J. Nanotechnol. 2017, 8, 530–538, doi:10.3762/bjnano.8.57
Dynamic of cold-atom tips in anharmonic potentials
- Tobias Menold,
- Peter Federsel,
- Carola Rogulj,
- Hendrik Hölscher,
- József Fortágh and
- Andreas Günther
Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148
A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans
- Tobias Meier,
- Alexander Förste,
- Ali Tavassolizadeh,
- Karsten Rott,
- Dirk Meyners,
- Roland Gröger,
- Günter Reiss,
- Eckhard Quandt,
- Thomas Schimmel and
- Hendrik Hölscher
Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46
Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations
- Jens Falter,
- Marvin Stiefermann,
- Gernot Langewisch,
- Philipp Schurig,
- Hendrik Hölscher,
- Harald Fuchs and
- André Schirmeisen
Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59
Advanced atomic force microscopy techniques
- Thilo Glatzel,
- Hendrik Hölscher,
- Thomas Schimmel,
- Mehmet Z. Baykara,
- Udo D. Schwarz and
- Ricardo Garcia
Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99
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